Development of a new data collection system and chamber for microbeam and laser investigations of single event phenomena

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 181, Issue 1-4, 2001, Pages 87-94

  Laird, J S ^a   Hirao, T ^a   Mori, H ^b   Onoda, S ^b   Kamiya, T ^a   Itoh, H ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b TOKAI UNIVERSITY   (Japan)

Author keywords

Charge collection; Cryogenic stage; Scanning ion deep level transient spectroscopy; Single event upset; Transient ion beam induced current; Transient laser beam induced current

Indexed keywords

CARRIER MOBILITY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; HEAVY IONS; LASER BEAM EFFECTS;

ION BEAM INDUCED CURRENTS;

ION BEAMS;

EID: 0035388003     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00565-1     Document Type: Conference Paper

References (13)