Effect of ion position on single-event transient current

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 130, Issue 1-4, 1997, Pages 486-490

  Hirao, Toshio ^a   Nashiyama, Isamu ^a   Kamiya, Tomihiro ^a   Suda, Tamotsu ^a   Sakai, Takuro ^a   Hamano, Tsuyoshi ^b  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; DIFFUSION; ELECTRIC CHARGE; ELECTRIC CURRENTS; OXYGEN; SEMICONDUCTOR JUNCTIONS;

ION MICROBEAMS; SINGLE EVENT TRANSIENT CURRENTS;

ION BEAMS;

EID: 0031549022     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00377-7     Document Type: Article

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