Effect of scanning resolution and fluence fluctuation on femtosecond laser ablation of thin films

Applied Physics A: Materials Science and Processing

Volumn 77, Issue 5, 2003, Pages 655-658

  Venkatakrishnan, K ^a   Stanley, P ^a   Sivakumar, N R ^a   Tan, B ^a   Lim, L E N ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; LASER ABLATION; MIRRORS; SCANNING; SCANNING ELECTRON MICROSCOPY;

LASER SCANNING;

THIN FILMS;

EID: 0042944310     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-002-1668-1     Document Type: Article

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