Reduction of ohmic contact resistivity on p-type GaN by surface treatment

Current Applied Physics

Volumn 1, Issue 4-5, 2001, Pages 385-388

  Kim, Jong Kyu ^a   Jang, Ho Won ^a   Jeon, Changmin ^a   Lee, Jong Lam ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

71.55.Eq; 73.40.Cg; 73.40.Ns; 73.61.Ey; Ohmic contact; P type GaN; Photoemission spectroscopy

Indexed keywords

EID: 0042919069     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1567-1739(01)00040-2     Document Type: Article

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