Extraction of inner shell from multiwall carbon nanotubes for scanning probe microscope tip

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 6 B, 2003, Pages 3933-3936

  Akita, Seiji ^a   Nakayama, Yoshikazu ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

Carbon nanotube; Nanomanipulation; Nanomechanics; Scanning probe microscopy

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRON MICROSCOPES; EXTRACTION; HELIUM;

NANOMANIPULATION;

CARBON NANOTUBES;

EID: 0042863392     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.3933     Document Type: Conference Paper

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