Strain-tuning of optical devices with nanometer resolution

CIRP Annals - Manufacturing Technology

Volumn 52, Issue 1, 2003, Pages 431-434

  Kim, S G ^a   Wong, C W ^a   Jeon, Y B ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Nanometer resolution; Optical; Strain tuning

Indexed keywords

ACTUATORS; BAND STRUCTURE; CHARGE CARRIERS; CRYSTALLOGRAPHY; DIFFRACTION GRATINGS; ELECTROOPTICAL EFFECTS; MICROELECTROMECHANICAL DEVICES; NANOTECHNOLOGY; PIEZOELECTRIC DEVICES; THIN FILM DEVICES;

CHARGE CARRIER EFFECTS; MICROCAVITY PHOTONIC CRYSTALS; NANOMETER RESOLUTION; STRAIN TUNING; THERMOOPTICS; THIN FILM PIEZOELECTRIC ACTUATORS;

OPTICAL DEVICES;

EID: 0042844574     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)60618-0     Document Type: Article

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