Theoretical background of the optical charging spectroscopy method used for investigation of trapping levels

Applied Physics Letters

Volumn 73, Issue 12, 1998, Pages 1685-1687

  Pintilie, I ^a   Pintilie, L ^a   Petre, D ^a   Tivarus, C ^a   Botila, T ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005238392     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122245     Document Type: Article

References (16)

1. D. V. Lang, J. Appl. Phys. 45, 3022 (1974).
2. R. H. Bube, Phys. Rev. 83, 393 (1951).
3. O. Yoshie and M. Kamihara, Jpn. J. Appl. Phys., Part 1 24, 431 (1985).
4. T. Botila and N. Croitoru, Phys. Status Solidi A 19, 357 (1973).
5. T. Botila, Proceedings of the International Conference on Amorphous Semiconductors, September 1982, Vol. E, p. 52.
6. D. Petre, I. Pintilie, T. Botila, and M. L. Ciurea, J. Appl. Phys. 76, 2216 (1994).
7. W. S. Lau, T. S. Tan, N. P. Sandler, and B. S. Page, Jpn. J. Appl. Phys., Part 1 34, 757 (1995).
8. M. L. Ciurea and T. Botila, Phys. Status Solidi A 61, 487 (1980).
9. M. Prudenziati and C. Canali, Phys. Status Solidi A 32, 557 (1975).
10. T. Botila, D. Brancuş, I. Pintilie, L. Pintilie, and D. Petre, Inst. Phys. Conf. Ser. 160, 293 (1997).
11. D. Petre, I. Pintilie, M. L. Ciurea, and T. Botila, Thin Solid Films 260, 54 (1995).
12. W. S. Lau, K. K. Khaw, P. W. Qian, N. P. Sandler, and P. K. Chu, J. Appl. Phys. 79, 8841 (1996).
13. W. S. Lau, L. Zhong, A. Lee, C. H. See, T. Han, N. P. Sandler, and T. C. Chong, Appl. Phys. Lett. 71, 500 (1997).
14. P. S. Kireev, Semiconductor Physics (Mir, Moscow, 1975).
15. J. T. Randall and M. H. Wilkins, Proc. R. Soc. London, Ser. A 184, 366 (1945).
16. G. F. J. Garlick and A. F. Gibson, Proc. R. Soc. London 60, 574 (1948).