In situ conductance characterization of Fe/Ag multilayer contacts on GaAs

Journal of Applied Physics

Volumn 94, Issue 1, 2003, Pages 621-625

  Hite, D A ^a   Russek, S E ^a   Pappas, D P ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; ELECTRON TUNNELING; EPITAXIAL GROWTH; INTERFACES (MATERIALS); IRON; LEAKAGE CURRENTS; LOW ENERGY ELECTRON DIFFRACTION; MULTILAYERS; SCHOTTKY BARRIER DIODES;

MULTILAYER CONTACTS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0042842536     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1577398     Document Type: Article

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