Electrical properties of pulsed laser-deposited SrxBiyTa2O9 thin films on Bi/Sr ratios

Solid State Communications

Volumn 127, Issue 4, 2003, Pages 315-318

  Park, Jong Ho ^a   Kim, Chung Sik ^a   Choi, Byung Chun ^a   Jeong, Jung Hyun ^a   Moon, Byung Kee ^a   Seo, Hyo Jin ^a   Kim, Ill Won ^b   Kim, Jin Soo ^b  

^a Pukyong National University   (South Korea)

^b University of Ulsan   (South Korea)

Author keywords

A. Thin films; D. Dielectric response

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITORS; GRAIN BOUNDARIES; POLARIZATION; PULSED LASER DEPOSITION; STRONTIUM COMPOUNDS;

SURFACE POLARIZATION;

THIN FILMS;

EID: 0042671458     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(03)00433-2     Document Type: Article

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