Status of MBE technology for the flexible manufacturing of HgCdTe focal plane arrays

Journal of Electronic Materials

Volumn 25, Issue 8, 1996, Pages 1411-1415

  Rajavel, R D ^a   Jamba, D ^a   Wu, O K ^a   Roth, J A ^a   Brewer, P D ^a   Jensen, J E ^a   Cockrum, C A ^b   Venzor, G M ^b   Johnson, S M ^b  

^a Hughes Aircraft Co   (United States)

^b Santa Barbara Research Center   (United States)

Author keywords

As doping; HgCdTe; IR detectors; Molecular beam epitaxy (MBE)

Indexed keywords

EID: 3843061074     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655043     Document Type: Article

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