Sub-micron thin film intrinsic Josephson junctions

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 I, 2003, Pages 821-824

  Warburton, P A ^a   Kuzhakhmetov, A R ^a   Bell, C ^b   Burnell, G ^b   Blamire, M G ^b   Wu, H ^c   Grovenor, C R M ^c   Schneidewind, H ^d  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c UNIVERSITY OF OXFORD   (United Kingdom)

^d LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

Author keywords

Focussed ion beam milling; Josephson junctions; Nanofabrication

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); HYSTERESIS; INTERDIFFUSION (SOLIDS); ION BEAMS; MILLING (MACHINING); NANOTECHNOLOGY; OXIDE SUPERCONDUCTORS; SUPERCONDUCTING FILMS; THIN FILMS;

ION MILLINGS;

JOSEPHSON JUNCTION DEVICES;

EID: 0042441968     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.814056     Document Type: Conference Paper

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