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Volumn 362, Issue 1-4, 2001, Pages 150-155
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New approach for fabricating submicron scale intrinsic Josephson junctions using high-Tc superconducting materials
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Author keywords
3D; Bi2Sr2CaCu2O 8+d; Charging effect; Focused ion beam; Intrinsic Josephson junctions
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Indexed keywords
BISMUTH COMPOUNDS;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CRYSTAL WHISKERS;
CURRENT VOLTAGE CHARACTERISTICS;
ETCHING;
ION BEAMS;
JOSEPHSON JUNCTION DEVICES;
THIN FILMS;
FOCUSSED-ION-BEAM;
SUPERCONDUCTING MATERIALS;
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EID: 0035449020
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(01)00662-1 Document Type: Article |
Times cited : (21)
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References (20)
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