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Volumn 362, Issue 1-4, 2001, Pages 150-155

New approach for fabricating submicron scale intrinsic Josephson junctions using high-Tc superconducting materials

Author keywords

3D; Bi2Sr2CaCu2O 8+d; Charging effect; Focused ion beam; Intrinsic Josephson junctions

Indexed keywords

BISMUTH COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL WHISKERS; CURRENT VOLTAGE CHARACTERISTICS; ETCHING; ION BEAMS; JOSEPHSON JUNCTION DEVICES; THIN FILMS;

EID: 0035449020     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(01)00662-1     Document Type: Article
Times cited : (21)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.