Submicron stacked-junction fabrication from Bi2Sr2CaCu2O8+δ whiskers by focused-ion-beam etching

Applied Physics Letters

Volumn 74, Issue 8, 1999, Pages 1156-1158

  Kim, S J ^a   Latyshev, Yu I ^a   Yamashita, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000462129     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123472     Document Type: Article

References (22)

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