Challenges in integration of resonant interband tunnel devices with CMOS

Biennial University/Government/Industry Microelectronics Symposium - Proceedings

Volumn , Issue , 2003, Pages 275-278

  Sudirgo, Stephen ^a   Curanovic, Branislav ^a   Rommel, Sean L ^a   Hirschman, Karl D ^a   Kurinec, Santosh K ^a   Jin, Niu ^b   Rice, Anthony T ^b   Berger, Paul R ^b   Thompson, Phillip E ^c  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^b The Ohio State University   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

Author keywords

CMOS integration; Resonant Interband Tunneling Diodes (RITD); Resonant Tunneling Devices

Indexed keywords

CURRENT DENSITY; LITHOGRAPHY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; TUNNEL DIODES;

RESONANT INTERBAND TUNNELING DIODES (RTID);

CMOS INTEGRATED CIRCUITS;

EID: 0042440880     PISSN: 07496877     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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