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Volumn 102, Issue 1-3, 2003, Pages 262-268

Determination of doping levels and their distribution in SiC by optical techniques

Author keywords

Absorption mapping; Characterization; Doping; Silicon carbide

Indexed keywords

CARRIER CONCENTRATION; DOPING (ADDITIVES); LIGHT ABSORPTION; MAPPING; QUALITY CONTROL; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0042431975     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00707-9     Document Type: Conference Paper
Times cited : (26)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.