|
Volumn 102, Issue 1-3, 2003, Pages 262-268
|
Determination of doping levels and their distribution in SiC by optical techniques
|
Author keywords
Absorption mapping; Characterization; Doping; Silicon carbide
|
Indexed keywords
CARRIER CONCENTRATION;
DOPING (ADDITIVES);
LIGHT ABSORPTION;
MAPPING;
QUALITY CONTROL;
SEMICONDUCTING GALLIUM ARSENIDE;
ABSORPTION MAPPING;
SILICON CARBIDE;
|
EID: 0042431975
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(02)00707-9 Document Type: Conference Paper |
Times cited : (26)
|
References (17)
|