Crystal orientation of silver films on silicon surfaces revealed by surface x-ray diffraction

Surface Review and Letters

Volumn 10, Issue 2-3, 2003, Pages 431-434

  Hata, A ^a   Akimoto, K ^a   Horii, S ^a   Emoto, T ^a   Ichimiya, A ^a   Tajiri, H ^b   Takahashi, T ^b   Sugiyama, H ^c   Zhang, X ^c   Kawata, H ^c  

^a NAGOYA UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; CRYSTAL ORIENTATION; DEPOSITION; PHASE TRANSITIONS; SILICON; SILVER; SUBSTRATES; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

RECIPROCAL LATTICE SPACE;

SURFACE CHEMISTRY;

SILICON; SILVER;

CONFERENCE PAPER; CRYSTAL; FILM; SURFACE PROPERTY; SYNCHROTRON; TEMPERATURE; X RAY DIFFRACTION;

EID: 0042346240     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x03005232     Document Type: Conference Paper

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