Ultimate low cost analog BIST

Proceedings - Design Automation Conference

Volumn , Issue , 2003, Pages 570-573

  Negreiros, Marcelo ^a   Carro, Luigi ^a   Susin, Altamiro Amadeu ^a  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

DSP based analog test; Low cost analog BIST; Test of analog circuits

Indexed keywords

ALGORITHMS; COSTS; FAULT TOLERANT COMPUTER SYSTEMS; RELIABILITY;

LINEAR ANALOG CIRCUITS;

DIGITAL SIGNAL PROCESSING;

EID: 0042134720     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775832.775977     Document Type: Conference Paper

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