Thermal and molecular stresses in multi-layered structures of nitride devices

Semiconductor Science and Technology

Volumn 18, Issue 8, 2003, Pages 733-737

  Dems, Maciej ^a   Nakwaski, Wlodzimierz ^a,b  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ENERGY GAP; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; MULTILAYERS; PIEZOELECTRICITY; STRESS ANALYSIS; THERMAL STRESS;

MECHANICAL MODEL; MOLECULAR STRESSES;

NITRIDES;

EID: 0042014365     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/18/8/303     Document Type: Article

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