-
1
-
-
85010176150
-
Phase shifting interferometry
-
2nd ed., D. Malacara, ed. (Wiley, New York, Chap
-
J. E. Greivenkamp and J. H. Bruning, “Phase shifting interferometry,” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), Chap. 14.
-
(1992)
Optical Shop Testing
, pp. 14
-
-
Greivenkamp, J.E.1
Bruning, J.H.2
-
2
-
-
77955701859
-
Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window
-
P. de Groot, “Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window,” Appl. Opt. 34, 4723-4730 (1995).
-
(1995)
Appl. Opt.
, vol.34
, pp. 4723-4730
-
-
De Groot, P.1
-
3
-
-
84893997835
-
Design and assessment of symmetrical phase-shifting algorithms
-
K. G. Larkin and B. F. Oreb, “Design and assessment of symmetrical phase-shifting algorithms,” J. Opt. Soc. Am. A 9, 1740-1748 (1992).
-
(1992)
J. Opt. Soc. Am. A
, vol.9
, pp. 1740-1748
-
-
Larkin, K.G.1
Oreb, B.F.2
-
4
-
-
0031673690
-
Punctuated quadrature phase-shifting interferometry
-
L. Deck and P. de Groot, “Punctuated quadrature phase-shifting interferometry,” Opt. Lett. 23, 19-21 (1998).
-
(1998)
Opt. Lett.
, vol.23
, pp. 19-21
-
-
Deck, L.1
De Groot, P.2
-
5
-
-
0002616284
-
Large flat panel profiler
-
J. C. Stover, ed., Proc. SPIE 2862
-
K. Freischlad, “Large flat panel profiler,” in Flatness, Roughness and Discrete Defect Characterization for Computer Disks, Wafers and Flat Panel Displays, J. C. Stover, ed., Proc. SPIE 2862, 163-171 (1996).
-
(1996)
Flatness, Roughness and Discrete Defect Characterization for Computer Disks, Wafers and Flat Panel Displays
, pp. 163-171
-
-
Freischlad, K.1
-
6
-
-
0001333023
-
Grating interferometer for flatness testing
-
P. de Groot, “Grating interferometer for flatness testing,” Opt. Lett. 21, 228-230 (1996).
-
(1996)
Opt. Lett.
, vol.21
, pp. 228-230
-
-
De Groot, P.1
-
9
-
-
0000989274
-
Measurement of transparent plates with wavelength-tuned phase-shifting interferometry
-
P. de Groot, “Measurement of transparent plates with wavelength-tuned phase-shifting interferometry,” Appl. Opt. 39, 2658-2663 (2000).
-
(2000)
Appl. Opt.
, vol.39
, pp. 2658-2663
-
-
De Groot, P.1
-
10
-
-
0001615193
-
Separate measurements of surface shapes and refractive index inhomogeneity of an optical element using tunable-source phase shifting interferometry
-
K. Okada, H. Sakuta, T. Ose, and J. Tsujiuchi, “Separate measurements of surface shapes and refractive index inhomogeneity of an optical element using tunable-source phase shifting interferometry,” Appl. Opt. 29, 3280-3285 (1990).
-
(1990)
Appl. Opt.
, vol.29
, pp. 3280-3285
-
-
Okada, K.1
Sakuta, H.2
Ose, T.3
Tsujiuchi, J.4
-
11
-
-
84880400781
-
Wavelength-shift interferometry for distance measurements using the Fourier transform technique for fringe analysis
-
M. Suematsu and M. Takeda, “Wavelength-shift interferometry for distance measurements using the Fourier transform technique for fringe analysis,” Appl. Opt. 30, 4046-4055 (1991).
-
(1991)
Appl. Opt.
, vol.30
, pp. 4046-4055
-
-
Suematsu, M.1
Takeda, M.2
-
13
-
-
0036425815
-
Absolute distance measurements using FTPSI with a widely tunable IR laser
-
W. Osten, ed., Proc. SPIE 4778
-
L. Deck, “Absolute distance measurements using FTPSI with a widely tunable IR laser,” in Interferometry XI: Applications, W. Osten, ed., Proc. SPIE 4778, 218-226 (2002).
-
(2002)
Interferometry XI: Applications
, pp. 218-226
-
-
Deck, L.1
-
14
-
-
0002637533
-
Simultaneous multiple surface measurements using Fourier-transform phase shifting interferometry
-
W. Osten and W. Juptner, eds., (Elsevier, Paris
-
L. Deck, “Simultaneous multiple surface measurements using Fourier-transform phase shifting interferometry,” in New Methods for the Acquisition, Processing and Evaluation of Data in Optical Metrology, W. Osten and W. Juptner, eds., (Elsevier, Paris, 2001), pp. 230-236.
-
(2001)
New Methods for the Acquisition, Processing and Evaluation of Data in Optical Metrology
, pp. 230-236
-
-
Deck, L.1
-
15
-
-
0035761344
-
Multiple surface phase-shifting interferometry
-
H. P. Stahl, ed., Proc. SPIE 4451
-
L. Deck, “Multiple surface phase-shifting interferometry,” in Optical Manufacturing and Testing IV, H. P. Stahl, ed., Proc. SPIE 4451, 424-431 (2001).
-
(2001)
Optical Manufacturing and Testing IV
, pp. 424-431
-
-
Deck, L.1
-
16
-
-
0000002167
-
Measurement of the inhomogeneity of a window
-
C. Ai and J. C. Wyant, “Measurement of the inhomogeneity of a window,” Opt. Eng. 30, 1399-1404 (1991).
-
(1991)
Opt. Eng.
, vol.30
, pp. 1399-1404
-
-
Ai, C.1
Wyant, J.C.2
-
17
-
-
0029250206
-
Vibration in phase-shifting interferometry
-
P. de Groot, “Vibration in phase-shifting interferometry,” J. Opt. Soc. Am. 12, 354-365 (1995).
-
(1995)
J. Opt. Soc. Am.
, vol.12
, pp. 354-365
-
-
De Groot, P.1
-
18
-
-
0017851927
-
On the use of windows for harmonic analysis with the discrete Fourier transform
-
F. J. Harris, “On the use of windows for harmonic analysis with the discrete Fourier transform,” Proc. IEEE 66, 51-83 (1978).
-
(1978)
Proc. IEEE
, vol.66
, pp. 51-83
-
-
Harris, F.J.1
|