Field mapping with the magnetic resonance force microscope

Journal of Applied Physics

Volumn 86, Issue 1, 1999, Pages 664-670

  Ruskell, Todd G ^a   Löhndorf, Markus ^a   Moreland, John ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041913944     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370781     Document Type: Article

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