Scanning Hall probe microscopy of superconductors and magnetic materials

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1202-1205

  Oral, A ^a   Bending, S J ^a   Henini, M ^b  

^a UNIVERSITY OF BATH   (United Kingdom)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001360259     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588514     Document Type: Article

References (5)

1. L. N. Vu, M. S. Wistrom, and D. J. Vanharkingen, Physica B 194, 1791 (1994).
2. Y. Martin, D. Rugar, and H. K. Wickramasinghe, Appl. Phys. Lett. 52, 244 (1988).
3. A. Moser, H. J. Hug, I. Parashikov, B. Stiefel, O. Fritz, H. Thomas, A. Baratoff, H.-J. Guntherodt, and P. Chaudhari, Phys. Rev. Lett. 74, 1847 (1995).
4. Y. Matsuda, A. Fukuhara, T. Yoshioka, S. Hasegawa, A. Tonomura, and Q. Ru, Phys. Rev. Lett. 66, 457 (1991).
5. A. M. Chang, H. D. Hallen, L. Harriot, H. F. Hess, H. L. Loa, J. Kao, R. E. Miller, and T. Y. Chang, Appl. Phys. Lett. 61, 1974 (1992).