Thallium overlayers on Si(1 1 1) studied by scanning tunneling microscopy

Surface Science

Volumn 543, Issue 1-3, 2003, Pages

  Kotlyar, V G ^a   Saranin, A A ^a,b   Zotov, A V ^a,c   Kasyanova, T V ^a,b  

^a INSTITUTE OF AUTOMATION AND CONTROL PROCESSES   (Russian Federation)

^b FAR EASTERN FEDERAL UNIVERSITY   (Russian Federation)

^c VLADIVOSTOK STATE UNIVERSITY OF ECONOMICS AND SERVICE   (Russian Federation)

Author keywords

Atom solid interactions; Scanning tunneling microscopy; Silicon; Surface structure, morphology, roughness, and topography; Thallium

Indexed keywords

SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE STRUCTURE; THALLIUM;

PROTRUSIONS;

SURFACE ROUGHNESS;

EID: 0041828653     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.08.004     Document Type: Article

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