Fast and ultra-fast dissipation and fluctuations in two-dimensional channels for nitride and arsenide FETs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5113, Issue , 2003, Pages 237-251

  Matulionis, Arvydas ^a  

^a CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

Author keywords

Arsenides; Fluctuations; Hot electron energy relaxation time; Hot phonon lifetime; Microwave noise; Nitrides; Two dimensional channels

Indexed keywords

ARSENIC COMPOUNDS; ELECTRIC FIELD EFFECTS; ELECTRON GAS; FIELD EFFECT TRANSISTORS; MICROWAVES; NITRIDES; RELAXATION PROCESSES; ULTRAFAST PHENOMENA;

FLUCTUATIONS; HOT-PHONON LIFETIME; MICROWAVE NOISE; RELAXATION TIME; TWO DIMENSIONAL CHANNELS; ULTRAFAST DISSIPATION;

SPURIOUS SIGNAL NOISE;

EID: 0041823633     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.488759     Document Type: Conference Paper

References (32)

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