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Volumn 42, Issue 14, 2003, Pages 2506-2512

Analysis of illumination coherence properties in small-source systems such as synchrotrons

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; APPROXIMATION THEORY; CONSTRAINT THEORY; IMAGE ANALYSIS; LIGHTING; SYNCHROTRONS;

EID: 0041592515     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.002506     Document Type: Article
Times cited : (6)

References (15)
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  • 2
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    • Marchesini, S.1    Coisson, R.2
  • 3
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    • Relationship between spatial coherence of synchrotron radiation and emittance
    • Y. Takayama, T. Hatano, T. Miyahara, and W. Okamoto, “Relationship between spatial coherence of synchrotron radiation and emittance,” J. Synchrotron Radiat. 5, 1187-1194 (1998).
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    • Takayama, Y.1    Hatano, T.2    Miyahara, T.3    Okamoto, W.4
  • 4
    • 0037059116 scopus 로고    scopus 로고
    • Diffractive optical elements based on Fourier optical techniques: A new class of optics for extreme ultraviolet and soft x-ray wavelengths
    • C. Chang, P. Naulleau, E. Anderson, K. Rosfjord, and D. At-twood, “Diffractive optical elements based on Fourier optical techniques: A new class of optics for extreme ultraviolet and soft x-ray wavelengths,” Appl. Opt. 41, 7384-7390 (2002).
    • (2002) Appl. Opt. , vol.41 , pp. 7384-7390
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  • 5
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    • Spatial coherence of synchrotron radiation
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    • Coisson, R.1
  • 6
    • 0004224256 scopus 로고
    • Wiley, New York, critical illumination: Sec. 7.2.1, Zernike approximation: Sec. 7.2.2, pp. 311; Van Cittert-Zernike theorem: Sec. 5.6, pp. 207-211; generalized Van Cittert-Zernike theorem: Sec. 5.6.4, pp. 218-222; Huygens-Fresnel principle: Sec. 5.4.1, pp. 196-198 and Sec. 7.1.4, pp. 296-300
    • Joseph W. Goodman, Statistical Optics, (Wiley, New York, 1985), critical illumination: Sec. 7.2.1, pp. 306; Zernike approximation: Sec. 7.2.2, pp. 311; Van Cittert-Zernike theorem: Sec. 5.6, pp. 207-211; generalized Van Cittert-Zernike theorem: Sec. 5.6.4, pp. 218-222; Huygens-Fresnel principle: Sec. 5.4.1, pp. 196-198 and Sec. 7.1.4, pp. 296-300.
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  • 8
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    • M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, (Cambridge University, Cambridge, UK, 1997), Zernike approximation: Sec. 10.5.2, pp. 522-524; Van Cittert-Zernike theorem: Sec. 10.4.2, pp. 508-512; displacement theorem: Sec. 9.1, pp. 460-464.
    • (1997) Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light , pp. 522-524
    • Born, M.1    Wolf, E.2
  • 9
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    • Spatial coherence characterization of undulator radiation
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  • 15
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    • Extreme-ultraviolet phase-shifting point-diffraction interferometer: A wave-front metrology tool with subangstrom reference-wave accuracy
    • P. Naulleau, K. A. Goldberg, S. H. Lee, C. Chang, D. Attwood, and J. Bokor, “Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy,” Appl. Opt. 38, 7252-7263 (1999).
    • (1999) Appl. Opt. , vol.38 , pp. 7252-7263
    • Naulleau, P.1    Goldberg, K.A.2    Lee, S.H.3    Chang, C.4    Attwood, D.5    Bokor, J.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.