-
1
-
-
0034053676
-
Three-dimensional cryoelectron microscopy of ribosomes
-
J. Frank, P. Penczek, R. K. Agrawal, R. A. Grassucci, and A. B. Heagle, "Three-dimensional cryoelectron microscopy of ribosomes.," Methods Enzymol. 317, 276-291 (2000).
-
(2000)
Methods Enzymol.
, vol.317
, pp. 276-291
-
-
Frank, J.1
Penczek, P.2
Agrawal, R.K.3
Grassucci, R.A.4
Heagle, A.B.5
-
2
-
-
20244379996
-
Single-particle electron cryomicroscopy: Towards atomic resolution
-
M. van Heel, B. Gowen, R. Matadeen, E. Orlova, R. Finn, T. Pape, D. Cohen, H. Stark, R. Schmidt, M. Schatz, and A. Patwardhan, "Single-particle electron cryomicroscopy: towards atomic resolution," Quart. Rev. Biophys. 33, 307-369 (2000).
-
(2000)
Quart. Rev. Biophys.
, vol.33
, pp. 307-369
-
-
Van Heel, M.1
Gowen, B.2
Matadeen, R.3
Orlova, E.4
Finn, R.5
Pape, T.6
Cohen, D.7
Stark, H.8
Schmidt, R.9
Schatz, M.10
Patwardhan, A.11
-
5
-
-
0002099162
-
The optical transfer theory of the electron microscope: Fundamental principles and applications
-
K.-J. Hanzen, "The optical transfer theory of the electron microscope: fundamental principles and applications," Adv. Opt. Electron Microsc. 4, 1-84 (1971).
-
(1971)
Adv. Opt. Electron Microsc.
, vol.4
, pp. 1-84
-
-
Hanzen, K.-J.1
-
6
-
-
0002170585
-
The theoretical resolution limit of the electron microscope
-
O. Scherzer, "The theoretical resolution limit of the electron microscope," J. Appl. Phys. 20, 20-29 (1949).
-
(1949)
J. Appl. Phys.
, vol.20
, pp. 20-29
-
-
Scherzer, O.1
-
7
-
-
0022705572
-
An extension of the standard theory of partial coherence for the effect of beam convergence in high resolution electron microscopy
-
W. Coene, D. Van Dyck, and J. Van Landuyt, "An extension of the standard theory of partial coherence for the effect of beam convergence in high resolution electron microscopy," Optik 73, 13-18 (1986).
-
(1986)
Optik
, vol.73
, pp. 13-18
-
-
Coene, W.1
Van Dyck, D.2
Van Landuyt, J.3
-
8
-
-
0015672282
-
The envelope of electron microscopic transfer functions for partially coherent illumination
-
J. Frank, "The envelope of electron microscopic transfer functions for partially coherent illumination," Optik 38, 519-536 (1973).
-
(1973)
Optik
, vol.38
, pp. 519-536
-
-
Frank, J.1
-
9
-
-
0019524637
-
Resolution and illumination coherence in electron microscopy
-
C. J. Humphreys and J. C. H. Spence, "Resolution and illumination coherence in electron microscopy," Optik 58, 125-144 (1981).
-
(1981)
Optik
, vol.58
, pp. 125-144
-
-
Humphreys, C.J.1
Spence, J.C.H.2
-
10
-
-
0017541997
-
Electron microscope transfer functions for partially coherent axial illumination and chromatic defocus spread
-
R. H. Wade and J. Frank, "Electron microscope transfer functions for partially coherent axial illumination and chromatic defocus spread," Optik 49, 81-92 (1977).
-
(1977)
Optik
, vol.49
, pp. 81-92
-
-
Wade, R.H.1
Frank, J.2
-
11
-
-
0018986793
-
Electron microscope transfer functions in closed form with tilted illumination
-
P. W. Hawkes, "Electron microscope transfer functions in closed form with tilted illumination," Optik 55, 207-212 (1980).
-
(1980)
Optik
, vol.55
, pp. 207-212
-
-
Hawkes, P.W.1
-
12
-
-
0042727786
-
The imaging of amorphous specimens in a tilted-beam electron microscope
-
S. C. McFarlane, "The imaging of amorphous specimens in a tilted-beam electron microscope," J. Phys. C 8, 2819-2836 (1975).
-
(1975)
J. Phys. C
, vol.8
, pp. 2819-2836
-
-
McFarlane, S.C.1
-
13
-
-
0016942567
-
Concerning tilted beam electron microscope transfer functions
-
R. H. Wade, "Concerning tilted beam electron microscope transfer functions," Optik 45, 87-91 (1976).
-
(1976)
Optik
, vol.45
, pp. 87-91
-
-
Wade, R.H.1
-
14
-
-
0017933689
-
Tilted beam electron microscopy: The effective coherent aperture
-
R. H. Wade and W. K. Jenkins, "Tilted beam electron microscopy: the effective coherent aperture," Optik 50, 1-17 (1978).
-
(1978)
Optik
, vol.50
, pp. 1-17
-
-
Wade, R.H.1
Jenkins, W.K.2
-
15
-
-
0018227155
-
Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms
-
F. Zemlin, K. Weiss, P. Schiske, W. Kunath, and K.-H. Herrmann, "Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms," Ultra-microscopy 3, 49-60 (1978).
-
(1978)
Ultra-microscopy
, vol.3
, pp. 49-60
-
-
Zemlin, F.1
Weiss, K.2
Schiske, P.3
Kunath, W.4
Herrmann, K.-H.5
-
16
-
-
0036250016
-
Coherent non-planar illumination of a defocused specimen: Consequences for transmission electron microscopy
-
A. Patwardhan, "Coherent non-planar illumination of a defocused specimen: consequences for transmission electron microscopy," Optik 113, 4-12 (2002).
-
(2002)
Optik
, vol.113
, pp. 4-12
-
-
Patwardhan, A.1
-
18
-
-
0042727781
-
General theory of linear, coherent optical data-processing systems
-
H. J. Butterweck, "General theory of linear, coherent optical data-processing systems," J. Opt. Soc. Am. 67, 60-70 (1977).
-
(1977)
J. Opt. Soc. Am.
, vol.67
, pp. 60-70
-
-
Butterweck, H.J.1
-
19
-
-
0019733101
-
Principles of optical data processing
-
E. Wolf, ed. North Holland, Amsterdam
-
H. J. Butterweck, "Principles of optical data processing," in Progress in Optics, E. Wolf, ed. (North Holland, Amsterdam, 1981), pp. 213-280.
-
(1981)
Progress in Optics
, pp. 213-280
-
-
Butterweck, H.J.1
-
20
-
-
0042226797
-
Operator description of optical computation systems with a partially coherent light source
-
V. P. Ivanchenkov and P. V. Orlov, "Operator description of optical computation systems with a partially coherent light source," Avtometriya 5, 63-70 (1985).
-
(1985)
Avtometriya
, vol.5
, pp. 63-70
-
-
Ivanchenkov, V.P.1
Orlov, P.V.2
-
21
-
-
0018983067
-
Fourier optics described by operator algebra
-
M. Nazarathy and J. Shamir, "Fourier optics described by operator algebra," J. Opt. Soc. Am. 70, 150-159 (1980).
-
(1980)
J. Opt. Soc. Am.
, vol.70
, pp. 150-159
-
-
Nazarathy, M.1
Shamir, J.2
-
22
-
-
0019570840
-
Holography described by operator algebra
-
M. Nazarathy and J. Shamir, "Holography described by operator algebra," J. Opt. Soc. Am. 71, 529-541 (1981).
-
(1981)
J. Opt. Soc. Am.
, vol.71
, pp. 529-541
-
-
Nazarathy, M.1
Shamir, J.2
-
25
-
-
0009056567
-
On the validity of the weak-phase and other approximations in the analysis of electron microscope images
-
D. L. Misell, "On the validity of the weak-phase and other approximations in the analysis of electron microscope images," J. Phys. D 9(13), 1849-1866 (1976).
-
(1976)
J. Phys. D
, vol.9
, Issue.13
, pp. 1849-1866
-
-
Misell, D.L.1
-
29
-
-
0015638081
-
Phase shift determination in single-sideband holography
-
K. H. Downing and B. M. Siegel, "Phase shift determination in single-sideband holography," Optik 38, 21-28 (1973).
-
(1973)
Optik
, vol.38
, pp. 21-28
-
-
Downing, K.H.1
Siegel, B.M.2
-
30
-
-
0004224256
-
-
Wiley, New York, Sec. 7.2.1
-
J. W. Goodman, Statistical Optics (Wiley, New York, 2000), Sec. 7.2.1, pp. 303-304.
-
(2000)
Statistical Optics
, pp. 303-304
-
-
Goodman, J.W.1
-
32
-
-
0032077383
-
Residual wave aberrations in the first spherical aberration corrected transmission electron microscope
-
S. Uhlemann and M. Haider, "Residual wave aberrations in the first spherical aberration corrected transmission electron microscope," Ultramicroscopy 72, 109-119 (1998).
-
(1998)
Ultramicroscopy
, vol.72
, pp. 109-119
-
-
Uhlemann, S.1
Haider, M.2
-
33
-
-
0009053672
-
The dependence of the spherical aberration coefficient of an electron-optical objective lens on object position and magnification
-
P. W. Hawkes, "The dependence of the spherical aberration coefficient of an electron-optical objective lens on object position and magnification," Br. J. Appl. Phys. 1, 131-133 (1968).
-
(1968)
Br. J. Appl. Phys.
, vol.1
, pp. 131-133
-
-
Hawkes, P.W.1
-
36
-
-
0032190822
-
A spherical-aberration-corrected 200 kV transmission electron microscope
-
M. Haider, H. Rose, S. Uhlemann, E. Schwan, B. Kabius, and K. Urban, "A spherical-aberration-corrected 200 kV transmission electron microscope," Ultramicroscopy 75, 53-60 (1998).
-
(1998)
Ultramicroscopy
, vol.75
, pp. 53-60
-
-
Haider, M.1
Rose, H.2
Uhlemann, S.3
Schwan, E.4
Kabius, B.5
Urban, K.6
-
37
-
-
0003521799
-
-
Plenum, New York, Sec. 9
-
D. B. Williams and C. B. Carter, Transmission Electron Microscopy: a Textbook for Materials Science (Plenum, New York, 1996), Sec. 9, p. 133.
-
(1996)
Transmission Electron Microscopy: A Textbook for Materials Science
, pp. 133
-
-
Williams, D.B.1
Carter, C.B.2
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