Coherent, non-planar illumination of a defocused specimen: Consequences for transmission electron microscopy

Optik (Jena)

Volumn 113, Issue 1, 2002, Pages 4-12

  Patwardhan, Ardan ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Huygens Fresnel principle; Magnification; Phase contrast; Single particle; Transfer function

Indexed keywords

ELECTRON SOURCES; FOURIER TRANSFORMS; OPTICAL TRANSFER FUNCTION; TRANSMISSION ELECTRON MICROSCOPY;

PHASE CONTRAST;

IMAGING SYSTEMS;

EID: 0036250016     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1078/0030-4026-00110     Document Type: Article

References (14)

1. The Escherichia coli large ribosomal subunit at 7.5 Å resolution
2. Single-particle electron cryo-microscopy: Towards atomic resolution
3. The potential and limitations of neutrons, electrons and x-rays for atomic-resolution microscopy of unstained biological molecules
4. The optical transfer theory of the electron microscope: Fundamental principles and applications
5. Note on the sign of the wave aberration in electron optics
6. Addendum "Note on the sign of the wave aberration in electron optics"
7. The sign of the wave aberration in electron optics
8. On the validity of the weak-phase and other approximations in the analysis of electron microscopic images
9. Magnification mismatches between micrographs: Corrective procedures and implications for structural analysis
10. On the spherical aberration constant
11. The dependence of the spherical aberration coefficient of an electron-optical objective lens on object position and magnification