Time-evolution of the GaAs(0 0 1) pre-roughening process

Surface Science

Volumn 540, Issue 2-3, 2003, Pages 491-496

  Ding, Z ^a   Bullock, D W ^a   Thibado, P M ^a   LaBella, V P ^b   Mullen, Kieran ^c  

^a UNIVERSITY OF ARKANSAS   (United States)

^b State University of New York   (United States)

^c University of Oklahoma   (United States)

Author keywords

Gallium arsenide; Scanning tunneling microscopy; Surface roughening; Surface structure, morphology, roughness, and topography; Surfaces defects

Indexed keywords

CRYSTAL DEFECTS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE;

SURFACE DEFECTS;

SURFACE ROUGHNESS;

EID: 0041559703     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00916-6     Document Type: Article

References (22)

1. Wen J.M., Evans J.W., Bartelt M.C., Burnett J.W., Thiel P.A. Phys. Rev. Lett. 76:1996;652.
2. Morgenstern K., Rosenfeld G., Comsa G. Phys. Rev. Lett. 76:1996;2113.
3. Hannon J.B., Klunker C., Giesen M., Ibach H., Bartelt N.C., Hamilton J.C. Phys. Rev. Lett. 79:1997;2506.
4. Giesen M., Schulze Icking-Konert G., Ibach H. Phys. Rev. Lett. 80:1998;552.
5. Morgenstern K., Rosenfeld G., Laegsgaard E., Besenbacher F., Comsa G. Phys. Rev. Lett. 80:1998;556.
6. Morgenstern K., Laegsgaard E., Stensgaard I., Besenbacher F. Phys. Rev. Lett. 83:1999;1613.
7. Voorhees P.W. J. Stat. Phys. 38:1985;232.
8. Johnson M.D., Leung K.T., Birch A., Orr B.G., Tersoff J. Surf. Sci. 350:1996;254.
9. Tersoff J., Johnson M.D., Orr B.G. Phys. Rev. Lett. 78:1997;282.
10. LaBella V.P., Bullock D.W., Anser M., Ding Z., Emery C., Bellaiche L., Thibado P.M. Phys. Rev. Lett. 84:2000;4152.
11. Thibado P.M., Salamo G.J., Baharav Y. J. Vac. Sci. Technol. B. 17:1999;253.
12. Smathers J.B., Bullock D.W., Ding Z., Salamo G.J., Thibado P.M., Gerace B., Wirth W. J. Vac. Sci. Technol. B. 16:1998;3112.
13. LaBella V.P., Yang H., Bullock D.W., Thibado P.M., Kratzer P., Scheffler M. Phys. Rev. Lett. 83:1999;2989.
14. den Nijs M. Phys. Rev. Lett. 64:1990;435.
15. Yang H., LaBella V.P., Bullock D.W., Ding Z., Smathers J.B., Thibado P.M. J. Cryst. Growth. 201-202:1999;88.
16. Schwoebel R.L. J. Appl. Phys. 40:1969;614.
17. Tsao J.Y. Materials Fundamentals of Molecular Beam Epitaxy. 1993;Academic Press, Boston.
18. LaBella V.P., Bullock D.W., Ding Z., Emery C., Harter W.G., Thibado P.M. J. Vac. Sci. Technol. A. 18:2000;1526.
19. Kley A., Ruggerone P., Scheffler M. Phys. Rev. Lett. 79:1997;5278.
20. Hohenberg P.C., Halperin B.I. Rev. Mod. Phys. 49:1977;435.
21. Stanley H.E. Introduction to Phase Transition and Critical Phenomenon. 1971;Oxford University Press, New York.
22. Domb C. The Critical Point. 1996;Taylor & Francis, London.