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Volumn , Issue , 2003, Pages 228-231

170 V super junction - LDMOST in a 0.5 μm Commercial CMOS/SOS technology

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC BREAKDOWN; SEMICONDUCTOR JUNCTIONS;

EID: 0041513434     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (24)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.