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Volumn 210, Issue , 2003, Pages 186-190

IBIC characterisation of novel detectors for single atom doping of quantum computer devices

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRIC CHARGE; ION IMPLANTATION; QUANTUM ELECTRONICS; SILICA; SOLID STATE DEVICES;

EID: 0041512064     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)01060-7     Document Type: Conference Paper
Times cited : (5)

References (16)
  • 1
    • 0041793001 scopus 로고    scopus 로고
    • Proceedings (Cat. No.98EX144). IEEE. Part Vol. 2, Piscataway, NJ, USA
    • 1998 International Conference on Ion Implantation Technology, Proceedings (Cat. No.98EX144). IEEE. Part Vol. 2, 1998, p. 1039, Vol. 2. Piscataway, NJ, USA.
    • (1998) 1998 International Conference on Ion Implantation Technology , vol.2 , pp. 1039
  • 6
    • 0032516155 scopus 로고    scopus 로고
    • Kane B.E. Nature. 393:1998;133.
    • (1998) Nature , vol.393 , pp. 133
    • Kane, B.E.1
  • 13
    • 0035388564 scopus 로고    scopus 로고
    • New generation nuclear microprobe systems
    • Jamieson D.N. New generation nuclear microprobe systems. Nucl. Instr. and Meth. B. 181:2001;1.
    • (2001) Nucl. Instr. and Meth. B , vol.181 , pp. 1
    • Jamieson, D.N.1
  • 16
    • 0003934325 scopus 로고
    • New York/Chichester/Brisbane/Toronto: John Wiley & Sons
    • Knoll G.F. Radiation Detection and Measurement. 1979;John Wiley & Sons, New York/Chichester/Brisbane/Toronto. p. 395.
    • (1979) Radiation Detection and Measurement , pp. 395
    • Knoll, G.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.