Ion-beam-induced-charge characterisation of particle detectors

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 190, Issue 1-4, 2002, Pages 212-216

  Yang, C ^a   Jamieson, D N ^a   Hearne, S M ^a   Pakes, C I ^a   Rout, B ^a   Gauja, E ^b   Dzurak, A J ^b   Clark, R G ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Charge collection efficiency; Dead layer; IBIC; Ion beam damage; Nuclear microprobe; Pulse height defects

Indexed keywords

DEFECTS; HELIUM; ION BEAMS; ION IMPLANTATION; PHOTODIODES;

NUCLEAR MICROPROBES;

PARTICLE DETECTORS;

EID: 0036568965     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)00456-1     Document Type: Conference Paper

References (9)