Probing adhesive, mechanical, and thermal properties of polymer surfaces using scanning probe microscopy

ACS Symposium Series

Volumn 741, Issue , 1999, Pages 190-211

  Meyers, Gregory F ^a   DeKoven, Benjamin M ^a,c   Dineen, Michael T ^a   Strandjord, Andrew ^a,d   O'Connor, Paul J ^a   Hu, Terry ^a   Chiao, Yi Hung ^a   Pollock, Hubert M ^b   Hammiche, Azzedine ^b  

^a DOW CHEMICAL COMPANY   (United States)

^b LANCASTER UNIVERSITY   (United Kingdom)

^c Intevac Inc   (United States)

^d IC Interconnects   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041409782     PISSN: 00976156     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (22)

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