Differentiation between tracks and damages in SSNTD under the atomic force microscope

Radiation Measurements

Volumn 36, Issue 1-6 SPEC., 2003, Pages 155-159

  Ho, J P Y ^a   Yip, C W Y ^a   Nikezic, D ^a   Yu, K N ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Alpha tracks; Atomic force microscope; SSNTD

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETCHING; SURFACE ROUGHNESS;

ALPHA TRACKS;

RADIATION DETECTORS;

EID: 0041363219     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(03)00114-8     Document Type: Conference Paper

References (11)

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