|
Volumn 31, Issue 1, 1999, Pages 209-212
|
Observation of nuclear track in organic material by atomic force microscopy in real time during etching
a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ALPHA PARTICLES;
ATOMIC FORCE MICROSCOPY;
ETCHING;
IRRADIATION;
MORPHOLOGY;
PARTICLE BEAM TRACKING;
SCANNING TUNNELING MICROSCOPY;
SOLIDS;
SURFACES;
CELLULOSE NITRATE DETECTOR;
NUCLEAR TRACK;
PARTICLE DETECTORS;
|
EID: 0032590727
PISSN: 13504487
EISSN: None
Source Type: Journal
DOI: 10.1016/S1350-4487(99)00092-X Document Type: Article |
Times cited : (10)
|
References (6)
|