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Volumn 31, Issue 1, 1999, Pages 209-212

Observation of nuclear track in organic material by atomic force microscopy in real time during etching

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; ATOMIC FORCE MICROSCOPY; ETCHING; IRRADIATION; MORPHOLOGY; PARTICLE BEAM TRACKING; SCANNING TUNNELING MICROSCOPY; SOLIDS; SURFACES;

EID: 0032590727     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(99)00092-X     Document Type: Article
Times cited : (10)

References (6)
  • 1
  • 3
    • 0003692711 scopus 로고
    • Guntherodt H.J., Anselmetti D. and Meyer E., Eds Nato-Asi Series, Series E : Applied Sciences, Kluwer Academic Publishers, Dordrecht
    • Guntherodt H.J., Anselmetti D. and Meyer E., Eds (1995) Forces in scanning probe methods, Nato-Asi Series, Series E : Applied Sciences, Kluwer Academic Publishers, Dordrecht.
    • (1995) Forces in Scanning Probe Methods
  • 6
    • 0031549158 scopus 로고    scopus 로고
    • Ion irradiation induced chemical changes of polymers used for optical applications
    • Rück D. M ., Schulz J. and Deusch N. (1997) Ion irradiation induced chemical changes of polymers used for optical applications. Nucl. Inst. And Meth B 94 , 149-158.
    • (1997) Nucl. Inst. and Meth B , vol.94 , pp. 149-158
    • Rück, D.M.1    Schulz, J.2    Deusch, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.