CR-39 Sensitivity analysis on heavy ion beam with atomic force microscope

Radiation Measurements

Volumn 28, Issue 1-6, 1997, Pages 227-230

  Yamamoto, M ^a   Yasuda, N ^a   Kaizuka, Y ^a,c   Yamagishi, M ^a,b   Kanai, T ^a   Ishigure, N ^a   Furukawa, A ^a   Kurano, M ^a   Miyahara, N ^a   Nakazawa, M ^c   Doke, T ^a,d   Ogura, K ^a,e  

^a NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES   (Japan)

^b TOHO UNIVERSITY   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d WASEDA UNIVERSITY   (Japan)

^e NIHON UNIVERSITY   (Japan)

Author keywords

AFM (Atomic Force Microscope); CR 39; Heavy ion cancer treatment; Nuclear track detector; Sensitivity

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETCHING; ION BEAMS; ONCOLOGY; POLYCARBONATES; RADIOTHERAPY; SENSITIVITY ANALYSIS;

HEAVY ION CANCER TREATMENT; SOLID STATE NUCLEAR TRACK DETECTORS;

PARTICLE DETECTORS;

EID: 0031342527     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(97)00073-5     Document Type: Article

References (7)

1. Drindic M., He Y.D., Price P.B., Snowden-Ifft D.P. and Westphal A.J.(1994) Atomic-force-microscopic study of etched nuclear tracks at extremely short distance scale, Nucl. Inst. Meth. B93, 52
2. Dischner M., Hagen T., Sedlacek M., Ackermann J., Amgert N., Neumann R. and Trautmann C. (1995) Ion track diameter studied with scanning force microscopy, GSI Report 95-1, 196
3. Henke R., Ogura K. and Benton E.V. (1986) Standard Method for Measurement of Bulk Etch in CR-39, Nuclear Tracks 12, 307-310
4. Price P.B. (1993) Advances in solid state nuclear track detectors, Nucl. Tracks 22, 9-21
5. Ruddy F.H., Knowles H.B., Luckstead S.C. and Tripard G.E. (1977) Etch induction time in cellulose nitrate: A new particle identification parameter, Nucl. Inst. Meth. 147, 25
6. Yamamoto M., Kanai T., Ishigure N., Furukawa A., Hayata I., Nagasaka H and Ogura K. (1996) Analysis of minute etch pits of charged particle tracks in CR-39 using an atomic force microscope., National Institute of Radiological Science, Annual Report, NIRS-34 (1996).
7. Zhong Q., Innis D., Kjoller K. and Elings V.B. (1993) Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy, Surface Science Letters 290, L688.