The atomic force microscope as a fine tool for nuclear track studies

Radiation Measurements

Volumn 34, Issue 1-6, 2001, Pages 189-191

  Vazquez Lopez C ^a   Fragoso, R ^a   Golzarri, J I ^a   Castillo Mejia F ^a   Fujii, M ^a   Espinosa, G ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

AFM; Atomic force microscope; Nuclear tracks; Surface analysis; Track analysis

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; IMPACT IONIZATION; IONIZING RADIATION; PARTICLE BEAM TRACKING; SURFACE ROUGHNESS;

IONIZING NUCLEAR PARTICLES; NUCLEAR TRACK DETECTORS;

PARTICLE DETECTORS;

EID: 0034742307     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(01)00149-4     Document Type: Article

References (7)

1. Atomic force microscopic studies of etched tracks at extremely short distance scale
2. Investigations of nuclear reaction products by Atomic Force Microscopy
3. Direct observation of latent nuclear tracks in organic material by atomic force microscopy
4. CR-39 sensitivity analysis on heavy ion beam with atomic force microscope
5. Measurement of bulk etch rate of CR-39 with atomic force microscopy
6. Track sensitivity and the surface roughness measurements of CR39 with atomic force microscope