Measurements of geometric enhancement factors for silicon nanopillar cathodes using a scanning tunneling microscope

Applied Physics Letters

Volumn 79, Issue 9, 2001, Pages 1348-1350

  Lewis, P A ^b   Alphenaar, B W ^a,b   Ahmed, H ^b  

^a University of Louisville   (United States)

^b HITACHI CAMBRIDGE LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040752618     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1396821     Document Type: Article

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