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Applied Physics Letters

Volumn 76, Issue 20, 2000, Pages 2961-2963

Field emission study of diamond-like carbon films with scanned-probe field-emission force microscopy

(3) Inoue, Takahito a,b Ogletree, D Frank a Salmeron, Miquel a

a UNIVERSITY OF CALIFORNIA (United States)

b ELECTROTECHNICAL LABORATORY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003726321 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.126530 Document Type: Article

Times cited : (18)

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