Optical near-field imaging using the Kelvin probe technique

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 9 PART A/B, 1998, Pages

  Abe, Masayuki ^a   Sugawara, Yasuhiro ^a   Sawada, Kazuyoshi ^a   Andoh, Yoshitake ^a   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Contact potential difference; Evanescent field; Frequency modulation detection method; Kelvin probe technique; Near field optics; Noncontact atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFERENTIAL EQUATIONS; ELECTRIC CONTACTS; ELECTROMAGNETIC FIELD EFFECTS; GOLD; IMAGING TECHNIQUES; PROBES; SPUTTERING; SURFACE PROPERTIES; SURFACES;

CONTACT POTENTIAL DIFFERENCE; KELVIN PROBE TECHNIQUE; OPTICAL NEAR FIELD IMAGING;

ELECTRIC VARIABLES MEASUREMENT;

EID: 0032154985     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.l1074     Document Type: Article

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