Measurement of the evanescent field using noncontact mode atomic force microscope

Optical Review

Volumn 4, Issue 1 PART B, 1997, Pages 232-235

  Abe, Masayuki ^a   Uchihashi, Takayuki ^a   Ohta, Masahiro ^b   Ueyama, Hitoshi ^b   Sugawara, Yasuhiro ^b   Morita, Seizo ^b  

^a HIROSHIMA UNIVERSITY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Evanescent field; Force gradient; Frequency modulation detection method; Noncontact mode atomic force microscope

Indexed keywords

EID: 0031535077     PISSN: 13406000     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf02931687     Document Type: Article

References (12)

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