Determination of the atomic structure of inversion domain boundaries in α-GaN by transmission electron microscopy

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 77, Issue 1, 1998, Pages 273-286

  Cherns, D ^a   Young, W T ^a   Saunders, M ^a   Steeds, J W ^a   Ponce, F A ^b   Nakamura, S ^c  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b PALO ALTO RESEARCH CENTER   (United States)

^c NICHIA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039573741     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619808214243     Document Type: Article

References (19)

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