Observation of the Huygens-principle growth mechanism in sputtered W/Si multilayers

Europhysics Letters

Volumn 36, Issue 8, 1996, Pages 565-570

  Salditt, T ^a   Lott, D ^a   Metzger, T H ^a   Peisl, J ^a   Fischer, R ^b   Zweck, J ^b   Hoghoj P ^c   Scharpf O ^c   Vignaud, G ^d  

^a UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF REGENSBURG   (Germany)

^c INSTITUT LAUE LANGEVIN   (France)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030579507     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i1996-00270-x     Document Type: Article

References (15)

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