Interfacial roughness and related growth mechanisms in sputtered W/Si multilayers

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 8, 1996, Pages 5860-5872

  Salditt, T ^a   Lott, D ^a   Metzger, T ^a   Peisl, J ^a   Vignaud, G ^b  

^a UNIVERSITY OF MUNICH   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001513841     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.5860     Document Type: Article

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