X-ray diffraction and Raman scattering study of SrBi2Ta2O9 ceramics and thin films with Bi3TiNbO9 addition

Applied Physics Letters

Volumn 79, Issue 23, 2001, Pages 3827-3829

  Zhu, J S ^a   Qin, H X ^a   Bao, Z H ^a   Wang, Y N ^a   Cai, W Y ^b   Chen, P P ^b   Lu, W ^b   Chan, H L W ^c   Choy, C L ^c  

^a NANJING UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^c HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039147850     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1421642     Document Type: Article

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