Evaluation of thick-film resistor structural parameters based on noise index measurements

Microelectronics Reliability

Volumn 41, Issue 1, 2001, Pages 59-66

  Jevtic M M ^a   Stanimirovic Z ^b   Stanimirovic I ^b  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b Inst   (Yugoslavia)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; SEMICONDUCTING FILMS; SPURIOUS SIGNAL NOISE; THICK FILMS; TRANSPORT PROPERTIES;

THICK-FILM RESISTORS;

RESISTORS;

EID: 0035151129     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00207-9     Document Type: Article

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