Low-frequency noise in thick-film resistors due to two-step tunneling process in insulator layer of elemental MIM cell

IEEE Transactions on Components and Packaging Technologies

Volumn 22, Issue 1, 1999, Pages 120-125

  Jevtic, Milan M ^a   Stanimirovic, Zdravko ^b   Mrak, Ivanka ^b  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b IRITEL Telecommunications and Electronics Institute   (Yugoslavia)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC INSULATORS; ELECTRIC RESISTANCE; ELECTRON TRAPS; ELECTRON TUNNELING; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE; THICK FILM DEVICES;

ELEMENTAL CELLS; THICK FILM RESISTORS;

RESISTORS;

EID: 0033308616     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.759361     Document Type: Article

References (19)

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