Low-frequency noise characterization of very large value resistors

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 4, 2002, Pages 1808-1813

  Arnaboldi, C ^a   Bucci, C ^b   Cremonesi, O ^a   Fascilla, A ^a,c   Nucciotti, A ^a   Pavan, M ^a   Pessina, G ^a   Pirro, S ^b   Previtali, E ^a   Sisti, M ^a  

^a INFN SEZIONE DI MILANO BICOCCA   (Italy)

^b LABORATORI NAZIONALI DEL GRAN SASSO   (Italy)

^c UNIVERSITY OF INSUBRIA   (Italy)

Author keywords

High value resistors; Noise; Noise measurement; Semiconductor device noise

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; FREQUENCIES; SPURIOUS SIGNAL NOISE;

LOW-FREQUENCY NOISES;

RESISTORS;

EID: 0036703235     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801507     Document Type: Review

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