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Volumn 31, Issue 3, 1998, Pages 857-862

Phase-separation-induced surface patterns in thin polymer blend films

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; FREE ENERGY; INTERFACIAL ENERGY; NEUTRON REFLECTION; PHASE INTERFACES; PHASE SEPARATION; POLYMER BLENDS; SECONDARY ION MASS SPECTROMETRY; SURFACE STRUCTURE; SURFACE WAVES; THIN FILMS;

EID: 0032003118     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma970687g     Document Type: Article
Times cited : (191)

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