Growth and characterization of deep UV emitter structures grown on single crystal bulk AlN substrates

Materials Research Society Symposium - Proceedings

Volumn 743, Issue , 2002, Pages 439-443

  Hu, X ^a   Gaska, R ^a   Chen, C ^b   Yang, J ^b   Kuokstis, E ^b   Khan, A ^b   Tamulaitis, G ^c,e   Yilmaz, I ^c   Shur, M S ^c   Rojo, J C ^d   Schowalter, L J ^d  

^a SENSOR ELECTRONIC TECHNOLOGY INC   (United States)

^b UNIVERSITY OF SOUTH CAROLINA   (United States)

^c RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^d Crystal IS Inc   (United States)

^e VILNIUS UNIVERSITY   (Lithuania)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS; TEMPERATURE; X RAY SPECTROSCOPY;

CHEMICAL COMPATIBILITY; DEEP ULTRAVIOLET EMITTER STRUCTURES; LUMINESCENCE INTENSITY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0038710485     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-743-l6.30     Document Type: Conference Paper

References (6)

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