Scribing into hydrogenated diamond surfaces using atomic force microscopy

Applied Physics Letters

Volumn 82, Issue 19, 2003, Pages 3336-3338

  Rezek, B ^a,c   Sauerer, C ^a   Garrido, J A ^a   Nebel, C E ^a   Stutzmann, M ^a   Snidero, E ^b   Bergonzo, P ^b  

^a WALTER SCHOTTKY INSTITUT   (Germany)

^b DIF   (France)

^c INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; HYDROGENATION; PATTERN RECOGNITION; REMOVAL; SILICON; THIN FILMS;

SURFACE TERMINATION;

SEMICONDUCTING DIAMONDS;

EID: 0038656736     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1576507     Document Type: Article

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