Enhancement of photoluminescence in Ge nanoparticles by neighboring amorphous C in composite Ge/C thin films

Journal of Applied Physics

Volumn 93, Issue 10 1, 2003, Pages 6029-6033

  Zhu, Y ^a   Yuan, C L ^a   Ong, P P ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CARBON; COMPOSITE MATERIALS; CRYSTAL DEFECTS; GERMANIUM; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

COMPOSITE FILMS;

THIN FILMS;

EID: 0038624456     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1569995     Document Type: Article

References (22)

1. H. Takagi, H. Ogawa, Y. Yamazaki, A. Ishizaki, and Y. Kanemitsu. Appl. Phys. Lett. 56, 2349 (1990).
2. Y. Maeda, N. Tsukamoto, Y. Yazawa, Y. Kanemitsu, and Y. Masumoto, Appl. Phys. Lett. 59, 3168 (1991).
3. Y. Kanemitsu, Thin Solid Films 276, 44 (1996).
4. J. Yuan, D. Haneman, W. Li, and T. Zhang, Semicond. Sci. Technol. 13, 130 (1998).
5. M. Fuji, S. Hayashi, and K. Yamamoyo, Jpn. J. Appl. Phys., Part 1 30, 687 (1991).
6. D. C. Paine, C. Caragianis, T. Shigesato, and T. Ishikawa, Appl. Phys. Lett. 62, 2842 (1993).
7. Y. Maeda, Phys. Rev. B 51, 1658 (1995).
8. L. A. Chiu, A. A. Seraphin, and K. D. Kolenbrander, J. Electron. Mater. 23, 347 (1994).
9. I. A. Movtchan, W. Marine, R. W. Dreyfus, H. C. Le, M. Sentis, and M. Autric, Appl. Surf. Sci. 96-98, 251 (1996).
10. Y. Yamada, T. Orii, I. Umezu, S. Takeyama, and T. Yoshida, Jpn. J. Appl. Phys., Part 1 35, 1361 (1996).
11. S. Li, S. J. Silvers, and M. S. El-Shall, J. Phys. Chem. B 101, 1794 (1997).
12. D. B. Geohegan, A. A. Puretzky, G. Duscher, and S. J. Pennycook, Appl. Phys. Lett. 72, 2987 (1998).
13. Y. Zhu and P. P. Ong, J. Phys.: Condens. Matter 13, 4075 (2001).
14. Y. Zhu, C. L. Yuan, S. L. Quek, S. S. Chan, P. P. Ong, and Q. T. Li, J. Appl. Phys. 90, 5318 (2001).
15. L. P. Ginzburg, A. A. Gordeev, A. P. Gorchakov, and A. P. Jilinsky, J. Non-Cryst. Solids 183, 234 (1995).
16. M. Gallagher and U. Osterberg, J. Appl. Phys. 74, 2771 (1993).
17. A. Beyer, E. Muller, H. Sigg, S. Stutz, D. Grutzmacher, O. Leifeld, and K. Ensslin. Appl. Phys. Lett. 77, 3218 (2000).
18. O. G. Schmidt, C. Lange, K. Eberl, O. Kienzle, and F. Ernst, Appl. Phys. Lett. 71, 2340 (1997).
19. S. Schieker, O. G. Schmidt, K. Eberl, N. Y. Jin-Phillipp, and F. Phillipp, Appl. Phys. Lett. 72, 3344 (1998).
20. O. Leifeld, D. Grutzmacher, B. Muller, K. Kern, E. Kaxiras, and P. C. Kelires, Phys. Rev. Lett. 72, 972 (1999).
21. O. Leifeld, A. Beyer, E. Muller, K. Kern, and D. Grutzmacher, Mater. Sci. Eng., B 74, 222 (2000).
22. R. Butz and H. Luth, Thin Solid Films 336, 69 (1998).